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Applied Mathematics and Mechanics (English Edition) ›› 2014, Vol. 35 ›› Issue (5): 567-574.doi: https://doi.org/10.1007/s10483-014-1813-7

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Influence of atomic force microscope (AFM) probe shape on adhesion force measured in humidity environment

阳丽1 涂育松2 谭惠丽1   

  1. 1. College of Physics Science and Technology, Guangxi Normal University, Guilin 541004, Guangxi Province, P. R. China;
    2. Institute of Systems Biology, Shanghai University, Shanghai 200444, P. R. China
  • 收稿日期:2013-06-16 修回日期:2013-11-15 出版日期:2014-05-01 发布日期:2014-05-01

Influence of atomic force microscope (AFM) probe shape on adhesion force measured in humidity environment

YANG Li1, TU Yo-Song2, TAN Hui-Li1   

  1. 1. College of Physics Science and Technology, Guangxi Normal University, Guilin 541004, Guangxi Province, P. R. China;
    2. Institute of Systems Biology, Shanghai University, Shanghai 200444, P. R. China
  • Received:2013-06-16 Revised:2013-11-15 Online:2014-05-01 Published:2014-05-01

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被引次数

2

摘要： In micro-manipulation, the adhesion force has very important influence on behaviors of micro-objects. Here, a theoretical study on the effects of humidity on the adhesion force is presented between atomic force microscope (AFM) tips and substrate. The analysis shows that the precise tip geometry plays a critical role on humidity dependence of the adhesion force, which is the dominant factor in manipulating micro-objects in AFM experiments. For a blunt (paraboloid) tip, the adhesion force versus humidity curves tends to the apparent contrast (peak-to-valley corrugation) with a broad range. This paper demonstrates that the abrupt change of the adhesion force has high correlation with probe curvatures, which is mediated by coordinates of solid-liquid-vapor contact lines (triple point) on the probe profiles. The study provides insights for further understanding nanoscale adhesion forces and the way to choose probe shapes in manipulating micro-objects in AFM experiments.

关键词: capillary force, van derWaals force, adhesion force, curvatures probe shape

Abstract: In micro-manipulation, the adhesion force has very important influence on behaviors of micro-objects. Here, a theoretical study on the effects of humidity on the adhesion force is presented between atomic force microscope (AFM) tips and substrate. The analysis shows that the precise tip geometry plays a critical role on humidity dependence of the adhesion force, which is the dominant factor in manipulating micro-objects in AFM experiments. For a blunt (paraboloid) tip, the adhesion force versus humidity curves tends to the apparent contrast (peak-to-valley corrugation) with a broad range. This paper demonstrates that the abrupt change of the adhesion force has high correlation with probe curvatures, which is mediated by coordinates of solid-liquid-vapor contact lines (triple point) on the probe profiles. The study provides insights for further understanding nanoscale adhesion forces and the way to choose probe shapes in manipulating micro-objects in AFM experiments.

Key words: capillary force, van derWaals force, adhesion force, curvatures probe shape

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