Electric admittance analysis of quartz crystal resonator in thickness-shear mode induced by array of surface viscoelastic micro-beams

doi:10.1007/s10483-017-2154-6

Abstract

Abstract:

The electric admittance of a compound system composed of a thicknessshear mode (TSM) quartz crystal resonator (QCR) and an array of surface viscoelastic micro-beams (MBs) is studied. The governing equations of the MBs are derived from the Timoshenko-beam theory in consideration of shear deformation. The electrical admittance is described directly in terms of the physical properties of the surface epoxy resin (SU-8) MBs from an electrically forced vibration analysis. It is found that both the inertia effect and the constraint effect of the MBs produce competitive influence on the resonant frequency and admittance of the compound QCR system. By further comparing the numerical results calculated from the Timoshenko-beam model with those from the Euler-beam model, the shear deformation is found to lead to some deviation of an admittance spectrum. The deviations are revealed to be evident around the admittance peak(s) and reach the maximum when a natural frequency of the MBs is identical to the fundamental frequency of the QCR. Besides, a higher order vibration mode of the MBs corresponds to a larger deviation at the resonance.

Key words: thickness-shear mode (TSM), quartz crystal resonator (QCR), shear deformation, electrical admittance

2010 MSC Number:

O441.3

Jiemin XIE, Yuantai HU. Electric admittance analysis of quartz crystal resonator in thickness-shear mode induced by array of surface viscoelastic micro-beams. Applied Mathematics and Mechanics (English Edition), 2017, 38(1): 29-38.

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