Abstract: Temperature fluctuations in a mixing T-junction have been simulated on the FLUENT platform using the large eddy simulation (LES) turbulent flow model and a sub-grid scale Smagorinsky-Lilly model. The normalized mean and root mean square temperatures for describing time-averaged temperature and temperature fluctuation intensity, and the velocity are obtained. The power spectrum densities of temperature fluctuations, which are key parameters for thermal fatigue analysis and lifetime evaluation, are analyzed. Simulation results are consistent with experimental data published in the literature, showing that the LES is reliable. Several mixing processes under different conditions are simulated in order to analyze the effects of varying Reynolds number and Richardson number on the mixing course and thermal fluctuations.

Key words: numerical simulation, thermal fluctuation, T-junction, mixing