[1] Crow,L.H.,Confidence interval procedures for the weibull process with applications to reliability growth,Technometrics,24,1(1982),67-72.
[2] Crow,L.H,Confidence interal procedures for reliability growth analysis,ADA-044788(1977).
[3] Duane,J.T,IEEE,Trans,on Aerospace & Electronic system,2(1964),563-566.
[4] Fisz,M,Probability Theory and Mathemaitical Statististics,J Wiley Sons,New York(1963).
[5] Lee,L.and S.K.Lee,Some results on inferences fo the weibull process,Technometrics,20(1978),41-45. |